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[IEEE Proceedings of the IEEE 2001 International Interconnect Technology Conference - Burlingame, CA, USA (2001.06.6-2001.06.6)] Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) - Step coverage and continuity of an I-PVD Ta(N) barrier layer: limitations

[IEEE Proceedings of the IEEE 2001 International Interconnect Technology Conference - Burlingame, CA, USA (2001.06.6-2001.06.6)] Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461) - Step coverage and continuity of an I-PVD Ta(N) barrier layer: limitations

Tokei, Z.; McInerney, D.; Baklanov, M.; Beyer, G.P.; Maex, K.
  • 作者Tokei, Z.; McInerney, D.; Baklanov, M.; Beyer, G.P.; Maex, K.
  • 文件大小433.49KB
  • 发表时间2001
  • DOI10.1109/iitc.2001.930064
  • 页码213-215
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