发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - MOS transistors characterization by split C-V method

[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - MOS transistors characterization by split C-V method

Mileusnic, S.; Zivanov, M.; Habas, P.

作者Mileusnic, S.; Zivanov, M.; Habas, P.
文件大小363.27KB
发表时间2001
DOI10.1109/smicnd.2001.967515
页码503-506

← 返回【学霸图书馆】主页