[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Effect of gate metal on reliability of metamorphic HEMTs
- 作者Dammann, M.; Leuther, A.; Konstanzer, H.; Jantz, W.
- 文件大小172.21KB
- 发表时间2001
- DOI10.1109/gaasrw.2001.995734
- 页码87-88
[IEEE 1996 IEEE Digital Signal Processing Workshop Proceedings - Loen, Norway (1996.09.1-1996.09.4)] 1996 IEEE Digital Signal Processing Workshop Proceedings - 1996 IEEE Digital Signal Processing Workshop Proceedings1996
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