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[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Modeling HBT ledge variations for insight into GaAs HBT reliability

[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Modeling HBT ledge variations for insight into GaAs HBT reliability

Henderson, T.

作者Henderson, T.
文件大小497.67KB
发表时间2001
DOI10.1109/gaasrw.2001.995745
页码181-202

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