[IEEE ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics - Honolulu, HI, USA (21 July-2 Aug. 2000)] ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics (IEEE Cat. No.00CH37076) - Cryogenic characterization of ferroelectric materials
- 作者Pagoda, C.J.; Mulvihill, M.L.; Pilgrim, S.M.
- 卷第2卷
- 文件大小335.20KB
- 发表时间2001
- DOI10.1109/isaf.2000.942500
- 页码995-998