Electron field emission characteristics of textured silicon surface
- 作者Y. M. Fung; W. Y. Cheung; I. H. Wilson; D. Chen; J. B. Xu; S. P. Wong; R. W. M. Kwok
- 文件大小738.23KB
- 发表时间2001
- DOI10.1116/1.1361040
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