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Analysis and modeling of residual stress in diamond thin film deposited by the hot-filament chemical vapor deposition process

Analysis and modeling of residual stress in diamond thin film deposited by the hot-filament chemical vapor deposition process

Cha, Seung I.; Hong, Soon H.
  • 期刊名称Journal of Materials Research
  • 作者Cha, Seung I.; Hong, Soon H.
  • 卷第16卷
  • 期第7期
  • 印刷ISSN0884-2914
  • 电子ISSN2044-5326
  • 文件大小656.69KB
  • 发表时间2001-7
  • DOI10.1557/JMR.2001.0267
  • 页码1953-1959
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