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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - The future of delta I/sub DDQ/ testing

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - The future of delta I/sub DDQ/ testing

Kruseman, B.; van Veen, R.; van Kaam, K.

作者Kruseman, B.; van Veen, R.; van Kaam, K.
文件大小1037.53KB
发表时间2001
DOI10.1109/test.2001.966623
页码101-110

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