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Effects of TiN Deposition on the Characteristics of W/TiN/SiO[sub 2]/Si Metal Oxide Semiconductor Capacitors

Effects of TiN Deposition on the Characteristics of W/TiN/SiO[sub 2]/Si Metal Oxide Semiconductor Capacitors

Park, Dae-Gyu; Cho, Heung-Jae; Lim, Kwan-Yong; Cha, Tae-Ho; Yeo, In-Seok; Park, Jin Won
  • 期刊名称Journal of The Electrochemical Society
  • 作者Park, Dae-Gyu; Cho, Heung-Jae; Lim, Kwan-Yong; Cha, Tae-Ho; Yeo, In-Seok; Park, Jin Won
  • 卷第148卷
  • 期第9期
  • 印刷ISSN0013-4651
  • 文件大小192.84KB
  • 发表时间2001
  • DOI10.1149/1.1392322
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