Second-harmonic scanning optical microscopy of semiconductor quantum dots
Brian Vohnsen; Sergey I. Bozhevolnyi; Kjeld Pedersen; John Erland; Jacob R. Jensen; Jørn M. Hvam
- 作者Brian Vohnsen; Sergey I. Bozhevolnyi; Kjeld Pedersen; John Erland; Jacob R. Jensen; Jørn M. Hvam
- 卷第189卷
- 印刷ISSN0030-4018
- 文件大小338.27KB
- 发表时间2001
- DOI10.1016/s0030-4018(01)01042-2
- 页码305-311