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An improved method for determining the critical energy for interface trap generation of n-MOSFETs under Vg=Vd/2 stress mode

An improved method for determining the critical energy for interface trap generation of n-MOSFETs under Vg=Vd/2 stress mode

Fuchen Mu; Lingfeng Mao; Jianlin Wei; Changhua Tan; Mingzhen Xu

作者Fuchen Mu; Lingfeng Mao; Jianlin Wei; Changhua Tan; Mingzhen Xu
卷第45卷
期第3期
印刷ISSN0038-1101
文件大小110.13KB
发表时间2001
DOI10.1016/s0038-1101(01)00072-7
页码385-389

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