发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Numerical analysis for the effects of interface roughness on the attenuation amplitudes of Fowler–Nordheim tunneling current oscillations in ultrathin MOSFETs

Numerical analysis for the effects of interface roughness on the attenuation amplitudes of Fowler–Nordheim tunneling current oscillations in ultrathin MOSFETs

Lingfeng Mao; Heqiu Zhang; Jianlin Wei; Fuchen Mu; Changhua Tan; Mingzhen Xu

作者Lingfeng Mao; Heqiu Zhang; Jianlin Wei; Fuchen Mu; Changhua Tan; Mingzhen Xu
卷第45卷
期第7期
印刷ISSN0038-1101
文件大小132.94KB
发表时间2001
DOI10.1016/s0038-1101(01)00144-7
页码1081-1084

← 返回【学霸图书馆】主页