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$Matrix characterization using synchrotron radiation X-ray diffraction$

Matrix characterization using synchrotron radiation X-ray diffraction

R.C. Barroso; M.J. Anjos; R.T. Lopes; E.F.O. de Jesus; S.M. Simabuco; D. Braz; C.R.F. Castro

作者R.C. Barroso; M.J. Anjos; R.T. Lopes; E.F.O. de Jesus; S.M. Simabuco; D. Braz; C.R.F. Castro
卷第61卷
印刷ISSN0969-806X
文件大小113.25KB
发表时间2001
DOI10.1016/s0969-806x(01)00392-9
页码739-741

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