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[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - Intrinsic noise currents in deep submicron MOSFETs

[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - Intrinsic noise currents in deep submicron MOSFETs

Chih-Hung Chen, ; Deen, M.J.; Yuhua Cheng, ; Matloubian, M.

作者Chih-Hung Chen, ; Deen, M.J.; Yuhua Cheng, ; Matloubian, M.
卷第2卷
文件大小276.80KB
发表时间2001
DOI10.1109/mwsym.2001.967022
页码835-839

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