[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - Current distribution and stability of CNT's on porous Al/sub 2/O/sub 3/
- 作者Kaldasch, F.; Gunther, B.; Muller, G.; Engstler, J.; Schneider, J.J.
- 文件大小285.28KB
- 发表时间2001
- DOI10.1109/ivmc.2001.939635
- 页码25-26
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