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SPIE Proceedings [SPIE Aerospace/Defense Sensing, Simulation, and Controls - Orlando, FL (Monday 16 April 2001)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII - <title>Critical evaluation of test patterns for EO system performance characterization</title>

SPIE Proceedings [SPIE Aerospace/Defense Sensing, Simulation, and Controls - Orlando, FL (Monday 16 April 2001)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII - Critical evaluation of test patterns for EO system performance characterization

Bijl, Piet; Valeton, J. M.; Hogervorst, Maarten A.; Holst, Gerald C.
  • 作者Bijl, Piet; Valeton, J. M.; Hogervorst, Maarten A.; Holst, Gerald C.
  • 卷第4372卷
  • 印刷ISSN0277-786X
  • 文件大小748.79KB
  • 发表时间2001
  • DOI10.1117/12.439158
  • 页码27-38
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