SPIE Proceedings [SPIE Multispectral Image Processing and Pattern Recognition - Wuhan, China (Monday 22 October 2001)] Visualization and Optimization Techniques - Computer simulation of photosensitive process of image materials
- 作者Li, Xiaowei; Sun, Yuchen; Hu, Xiaoyong; Zhang, Lianshui; Censor, Yair; Ding, Mingyue
- 卷第4553卷
- 印刷ISSN0277-786X
- 文件大小132.11KB
- 发表时间2001
- DOI10.1117/12.441582
- 页码162-166