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Characterization of Defect Traps in SiO
<sub/>2</sub>
Thin Films

Characterization of Defect Traps in SiO ₂ Thin Films

Rosaye, Jean-Yves; Mialhe, Pierre; Charles, Jean-Pierre; Sakashita, Mitsuo; Ikeda, Hiroya; Sakai, Akira; Zaima, Shigeaki; Yasuda, Yukio

期刊名称Active and Passive Electronic Components
作者Rosaye, Jean-Yves; Mialhe, Pierre; Charles, Jean-Pierre; Sakashita, Mitsuo; Ikeda, Hiroya; Sakai, Akira; Zaima, Shigeaki; Yasuda, Yukio
卷第24卷
期第3期
印刷ISSN0882-7516
电子ISSN1563-5031
文件大小1672.59KB
发表时间2001
DOI10.1155/2001/57872
页码169-175

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