AES depth profiling multilayers of 3d transition metals
- 作者S. Baunack; S. Menzel; W. Brückner; D. Elefant
- 卷第179卷
- 印刷ISSN0169-4332
- 文件大小159.80KB
- 发表时间2001
- DOI10.1016/s0169-4332(01)00258-6
- 页码25-29
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