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Clustering of behavioral phases in FSMs and its applications to VLSI test

Clustering of behavioral phases in FSMs and its applications to VLSI test

Huawei Li; Yinghua Min; Zhongcheng Li
  • 作者Huawei Li; Yinghua Min; Zhongcheng Li
  • 卷第45卷
  • 期第6期
  • 印刷ISSN1009-2757
  • 电子ISSN1862-2836
  • 文件大小241.42KB
  • 发表时间2002-12
  • DOI10.1360/02yf9040
  • 页码462-478
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