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Film thickness dependence on the electrical and optical properties of PtSi/p-Si(1 0 0) Schottky barrier detector

Film thickness dependence on the electrical and optical properties of PtSi/p-Si(1 0 0) Schottky barrier detector

Yen-Tang Lyu; Ching-Ting Lee; Gwo-Ji Horng; Chia Ho; Ching-Yuan Lee; Chung-Sen Wu
  • 作者Yen-Tang Lyu; Ching-Ting Lee; Gwo-Ji Horng; Chia Ho; Ching-Yuan Lee; Chung-Sen Wu
  • 卷第74卷
  • 期第2期
  • 印刷ISSN0254-0584
  • 文件大小238.99KB
  • 发表时间2002
  • DOI10.1016/s0254-0584(01)00464-3
  • 页码177-181
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