Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices II. Results
- 作者Jungemann, C.; Neinhus, B.; Decker, S.; Meinerzhagen, B.
- 卷第49卷
- 期第7期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小273.00KB
- 发表时间2002
- DOI10.1109/ted.2002.1013284
- 页码1258-1264
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