Failure analysis requirements for nanoelectronics
- 期刊名称IEEE Transactions On Nanotechnology
- 作者Vallett, D.P.
- 卷第1卷
- 期第3期
- 印刷ISSN1536-125X
- 文件大小708.80KB
- 发表时间2002-09
- DOI10.1109/TNANO.2002.806826
- 页码117-121
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