High Quality GaN Grown by Facet-Controlled ELO (FACELO) Technique

H. Miyake; R. Takeuchi; K. Hiramatsu; H. Naoi; Y. Iyechika; T. Maeda; T. Riemann; F. Bertram; J. Christen

作者H. Miyake; R. Takeuchi; K. Hiramatsu; H. Naoi; Y. Iyechika; T. Maeda; T. Riemann; F. Bertram; J. Christen
卷第194卷
期第2期
印刷ISSN1862-6319
文件大小387.93KB
发表时间2002
DOI10.1002/1521-396x(200212)194:2<545::aid-pssa545>3.0.co;2-b
页码545-549

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