Effects of Rare-Earth Oxides on the Reliability of X7R Dielectrics
Sakabe, Yukio; Hamaji, Yukio; Sano, Harunobu; Wada, Nobuyuki
- 期刊名称Japanese Journal of Applied Physics
- 作者Sakabe, Yukio; Hamaji, Yukio; Sano, Harunobu; Wada, Nobuyuki
- 卷第41卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小737.64KB
- 发表时间2002-9-15
- DOI10.1143/jjap.41.5668
- 页码5668-5673