[IEEE 52nd Electronic Components and Technology Conference - San Diego, CA, USA (28-31 May 2002)] 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) - Thermal study of GaN-based HFET devices
Jeong Park, ; Selah Choe Park, ; Moo Whan Shin, ; Lee, C.C.
- 作者Jeong Park, ; Selah Choe Park, ; Moo Whan Shin, ; Lee, C.C.
- 文件大小596.31KB
- 发表时间2002
- DOI10.1109/ectc.2002.1008159
- 页码617-621