[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Identifying error-box parameters from the twelve-term vector network analyzer error model
Vandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; De Raedt, W.
- 作者Vandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; De Raedt, W.
- 文件大小663.09KB
- 发表时间2002
- DOI10.1109/arftgf.2002.1218697
- 页码157-165