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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - RTL level preparation of high-quality/low-energy/low-power BIST

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - RTL level preparation of high-quality/low-energy/low-power BIST

Santos, M.B.; Teixeira, I.C.; Teixeira, J.P.; Manich, S.; Rodriguez, R.; Figueras, J.
  • 作者Santos, M.B.; Teixeira, I.C.; Teixeira, J.P.; Manich, S.; Rodriguez, R.; Figueras, J.
  • 文件大小756.45KB
  • 发表时间2002
  • DOI10.1109/test.2002.1041835
  • 页码814-823
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