Microwave measurements of the absolute London penetration depth in double-sided YBa[sub 2]Cu[sub 3]O[sub 7−x] thin films on sapphire
- 作者A. G. Zaitsev; R. Schneider; G. Linker; F. Ratzel; R. Smithey; P. Schweiss; J. Geerk; R. Schwab; R. Heidinger
- 文件大小897.23KB
- 发表时间2002
- DOI10.1063/1.1435842
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