Characterization of quality of Ba[sub x]Sr[sub 1−x]TiO[sub 3] thin film by the commutation quality factor measured at microwaves

Razumov, S. V.; Tumarkin, A. V.; Gaidukov, M. M.; Gagarin, A. G.; Kozyrev, A. B.; Vendik, O. G.; Ivanov, A. V.; Buslov, O. U.; Keys, V. N.; Sengupta, L. C.; Zhang, X.

期刊名称Applied Physics Letters
作者Razumov, S. V.; Tumarkin, A. V.; Gaidukov, M. M.; Gagarin, A. G.; Kozyrev, A. B.; Vendik, O. G.; Ivanov, A. V.; Buslov, O. U.; Keys, V. N.; Sengupta, L. C.; Zhang, X.
卷第81卷
期第9期
印刷ISSN0003-6951
文件大小253.65KB
发表时间2002
DOI10.1063/1.1499987

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Characterization of quality of Ba[sub x]Sr[sub 1−x]TiO[sub 3] thin film by the commutation quality factor measured at microwaves