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[IEEE 6th International Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (23-26 Sept. 2002)] Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering - The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards

[IEEE 6th International Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (23-26 Sept. 2002)] Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering - The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards

Veshkurtsev, J.M.; Odinets, A.I.; Altyntsev, M.P.
  • 作者Veshkurtsev, J.M.; Odinets, A.I.; Altyntsev, M.P.
  • 文件大小318.01KB
  • 发表时间2002
  • DOI10.1109/apeie.2002.1075802
  • 页码112-115
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