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Electronic Localization around Stacking Faults in Silicon Carbide

Electronic Localization around Stacking Faults in Silicon Carbide

Iwata, Hisaomi; Lindefelt, Ulf; Öberg, Sven; Briddon, Patrick R.

期刊名称Materials Science Forum
作者Iwata, Hisaomi; Lindefelt, Ulf; Öberg, Sven; Briddon, Patrick R.
电子ISSN1662-9752
文件大小288.29KB
发表时间2002
DOI10.4028/www.scientific.net/MSF.389-393.529
页码529-532

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