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Current gain degradation in SiGe HBTs by hot carriers

Current gain degradation in SiGe HBTs by hot carriers

C. R. Gill; S. P. Mcalister; C. Storey; W. R. Mckinnon; S. Kovacic
  • 作者C. R. Gill; S. P. Mcalister; C. Storey; W. R. Mckinnon; S. Kovacic
  • 文件大小643.36KB
  • 发表时间2002
  • DOI10.1116/1.1503789
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