Correlation between defect structure and luminescence spectra in monocrystalline erbium-implanted silicon

N. A. Sobolev; A. M. Emel yanov; E. I. Shek; V. I. Vdovin; T. G. Yugova; S. Pizzini

作者N. A. Sobolev; A. M. Emel yanov; E. I. Shek; V. I. Vdovin; T. G. Yugova; S. Pizzini
文件大小161.25KB
发表时间2002
DOI10.1088/0953-8984/14/48/374

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