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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Hierarchical current density verification for electromigration analysis in arbitrarily shaped metallization patterns of analog circuits

[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Hierarchical current density verification for electromigration analysis in arbitrarily shaped metallization patterns of analog circuits

Jerke, G.; Lienig, J.

作者Jerke, G.; Lienig, J.
文件大小494.54KB
发表时间2002
DOI10.1109/date.2002.998314
页码464-469

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