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[IEEE Third IEEE International Vacuum Electronics Conference - Monterey, CA, USA (23-25 April 2002)] Third IEEE International Vacuum Electronics Conference (IEEE Cat. No.02EX524) - Integrated cathode testing

[IEEE Third IEEE International Vacuum Electronics Conference - Monterey, CA, USA (23-25 April 2002)] Third IEEE International Vacuum Electronics Conference (IEEE Cat. No.02EX524) - Integrated cathode testing

Longo, R.; Tighe, W.; Harrison, C.

作者Longo, R.; Tighe, W.; Harrison, C.
文件大小58.86KB
发表时间2002
DOI10.1109/ivelec.2002.999390

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