Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.
- 期刊名称Microscopy and Microanalysis
- 作者Pantel, R.; Jullian, S.; Dutartre, D.
- 卷第8卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小283.04KB
- 发表时间2002-08
- DOI10.1017/s1431927602107744
- 页码1174-1175
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