How to Select the Items for the Shopping List of Future High Resolution Electron Microscopists?
- 期刊名称Microscopy and Microanalysis
- 作者Van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A.
- 卷第8卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小86.34KB
- 发表时间2002-08
- DOI10.1017/s143192760210198x
- 页码94-95
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Surface Microanalysis with Slow ElectronsBauer, Ernst G. · Microscopy and Microanalysis · 2006
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Nanogenerators and NanopiezotronicsWang, ZL · Microscopy and Microanalysis · 2009
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