In silicoADME/Tox: why models fail
Terry R. Stouch; James R. Kenyon; Stephen R. Johnson; Xue-Qing Chen; Arthur Doweyko; Yi Li
- 作者Terry R. Stouch; James R. Kenyon; Stephen R. Johnson; Xue-Qing Chen; Arthur Doweyko; Yi Li
- 卷第17卷
- 印刷ISSN0920-654X
- 电子ISSN1573-4951
- 文件大小150.93KB
- 发表时间2003-02
- DOI10.1023/a:1025358319677
- 页码83-92