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[IEEE 57th IEEE Semiannual Vehicular Technology Conference. VTC 2003 - Jeju, South Korea (22-25 April 2003)] The 57th IEEE Semiannual Vehicular Technology Conference, 2003. VTC 2003-Spring. - Application of isolated diffraction edge (IDE) method for urban microwave path loss prediction

[IEEE 57th IEEE Semiannual Vehicular Technology Conference. VTC 2003 - Jeju, South Korea (22-25 April 2003)] The 57th IEEE Semiannual Vehicular Technology Conference, 2003. VTC 2003-Spring. - Application of isolated diffraction edge (IDE) method for urban microwave path loss prediction

Hyun Kyu Chung, ; Bertoni, H.L.
  • 作者Hyun Kyu Chung, ; Bertoni, H.L.
  • 卷第1卷
  • 文件大小272.38KB
  • 发表时间2003
  • DOI10.1109/vetecs.2003.1207531
  • 页码205-209
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