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[IEEE Comput. Soc 16th International Conference on VLSI Design. Concurrently with the 2nd International Conference on Embedded Systems Design - New Delhi, India (4-8 Jan. 2003)] 16th International Conference on VLSI Design, 2003. Proceedings. - Exclusive test and its applications to fault diagnosis

[IEEE Comput. Soc 16th International Conference on VLSI Design. Concurrently with the 2nd International Conference on Embedded Systems Design - New Delhi, India (4-8 Jan. 2003)] 16th International Conference on VLSI Design, 2003. Proceedings. - Exclusive test and its applications to fault diagnosis

Agrawal, V.D.; Dong Hyun Baik, ; Yong Chang Kim, ; Saluja, K.K.
  • 作者Agrawal, V.D.; Dong Hyun Baik, ; Yong Chang Kim, ; Saluja, K.K.
  • 文件大小855.49KB
  • 发表时间2003
  • DOI10.1109/ICVD.2003.1183128
  • 页码143-148
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