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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Deterministic test vector decompression in software using linear operations [SOC testing]

[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Deterministic test vector decompression in software using linear operations [SOC testing]

Balakrishnan, K.J.; Touba, N.A.

作者Balakrishnan, K.J.; Touba, N.A.
文件大小787.85KB
发表时间2003
DOI10.1109/VTEST.2003.1197655
页码225-231

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