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Electrothermal failure of metallized film capacitor end connections–computation of temperature rise at connection spots

Electrothermal failure of metallized film capacitor end connections–computation of temperature rise at connection spots

Qi, Xiaoguang; Boggs, Steven

期刊名称Journal of Applied Physics
作者Qi, Xiaoguang; Boggs, Steven
卷第94卷
期第7期
印刷ISSN0021-8979
文件大小337.83KB
发表时间2003
DOI10.1063/1.1602947

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