发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

[IEEE Comput. Soc 8th IEEE European Test Workshop (ETW 03) - Maastricht, Netherlands (25-28 May 2003)] The Eighth IEEE European Test Workshop, 2003. Proceedings. - On the selection of efficient arithmetic additive test pattern generators [logic test]

[IEEE Comput. Soc 8th IEEE European Test Workshop (ETW 03) - Maastricht, Netherlands (25-28 May 2003)] The Eighth IEEE European Test Workshop, 2003. Proceedings. - On the selection of efficient arithmetic additive test pattern generators [logic test]

Manich, S.; Garcia, L.; Balado, L.; Lupon, E.; Rius, J.; Rodriguez, R.; Figueras, J.
  • 作者Manich, S.; Garcia, L.; Balado, L.; Lupon, E.; Rius, J.; Rodriguez, R.; Figueras, J.
  • 文件大小264.02KB
  • 发表时间2003
  • DOI10.1109/etw.2003.1231662
  • 页码9-14
← 返回【学霸图书馆】主页