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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Layered approach to designing system test interfaces

[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Layered approach to designing system test interfaces

Man Wah Chiang, ; Zilic, Z.

作者Man Wah Chiang, ; Zilic, Z.
文件大小332.66KB
发表时间2003
DOI10.1109/vtest.2003.1197671
页码331-336

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