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Spatially resolved characterization of the microwave properties of superconducting thin films by low temperature microwave scanning near-field microscopy

Spatially resolved characterization of the microwave properties of superconducting thin films by low temperature microwave scanning near-field microscopy

Feng, Y.J.; Wu, L.Y.; Wang, K.L.; Jiang, T.; Kang, L.; Yang, S.Z.; Wu, P.H.
  • 期刊名称IEEE Transactions on Appiled Superconductivity
  • 作者Feng, Y.J.; Wu, L.Y.; Wang, K.L.; Jiang, T.; Kang, L.; Yang, S.Z.; Wu, P.H.
  • 卷第13卷
  • 期第2期
  • 印刷ISSN1051-8223
  • 文件大小285.95KB
  • 发表时间2003-06
  • DOI10.1109/tasc.2003.812041
  • 页码2901-2904
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