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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - New method for temperature-dependent thermal resistance and capacitance accurate extraction in high-voltage DMOS transistors

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - New method for temperature-dependent thermal resistance and capacitance accurate extraction in high-voltage DMOS transistors

Anghel, C.; Hefyene, N.; Gillon, R.; Tack, M.; Declercq, M.J.; Ionescu, A.M.

作者Anghel, C.; Hefyene, N.; Gillon, R.; Tack, M.; Declercq, M.J.; Ionescu, A.M.
文件大小283.07KB
发表时间2003
DOI10.1109/iedm.2003.1269183

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