[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Testing SoC interconnects for signal integrity using boundary scan
- 作者Tehranipour, M.H.; Ahmed, N.; Nourani, M.
- 文件大小300.52KB
- 发表时间2003
- DOI10.1109/vtest.2003.1197647
- 页码158-163