[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Temperature dependence of optical wavelength shift as a validation technique for pulsed laser diode array thermal modeling
- 作者Carter, J.; Snyder, D.; Reichenbaugh, J.
- 文件大小564.58KB
- 发表时间2003
- DOI10.1109/STHERM.2003.1194385
- 页码357-363