发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2003 Instrumentation and Measurement Technology Conference (IMTC 2003) - Vail, CO, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Evaluation of ADC testing systems using ADC transfer standard

[IEEE 2003 Instrumentation and Measurement Technology Conference (IMTC 2003) - Vail, CO, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Evaluation of ADC testing systems using ADC transfer standard

Haasz, V.; Roztocil, J.; Slepicka, D.

作者Haasz, V.; Roztocil, J.; Slepicka, D.
卷第2卷
文件大小428.93KB
发表时间2003
DOI10.1109/imtc.2003.1207969
页码1340-1344

← 返回【学霸图书馆】主页